Transmission Electron MicroscopeTEM JeolJEM 1400 Plus

Our laboratory is equipped with a Transmission Electron Microscope (80-120 kV) which allows for the study of thin samples (<100 nm) under ultra-high vacuum conditions. There are two main working conditions: Bright Field and Dark Field TEM image mode and Electron Diffraction. The system includes a digital scanning module (STEM) coupled with an EDS system, allowing for the chemical mapping of the elements present in a given sample.