Transmission Electron Microscopy
Electron microscopies are used for material imaging, elemental composition analysis and for material characterization, down to the nanometer scale.
In TEM and HR-TEM analysis, the imagings show morphology, the aggregate form and the internal structure of particles and materials. In addition, the images of the particles can be used to measure the particle size distribution of the material as well as offer the possibility to study point, linear and planar defects. TEM is also equipped with electron diffraction capability to identify a wide range of unknown materials and with an energy dispersive X-ray spectrometer (EDS) to easily obtain elemental composition.
For further information about our TEM and HR-TEM services, please contact: email@example.com
Dr. Andrea Ardu
phone: +39 070 675-6832, email: firstname.lastname@example.org