Transmission Electron Microscope Jeol JEM 2010 URP with GIF 80 - 200 kV

The system is equipped with a Gatan Imaging Filter (GIF) and allows for nanoscale resolution. In addition to the conventional characterization, our microscope is suitable for the study of point, linear and planar defects. The use of Electron Energy Loss Spectroscopy (EELS)  enables the identification and mapping of the chemical species providing information about the typology of the chemical bonding present in the system.