Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (ESEM)

Electron microscopies are used for material imaging, elemental composition analysis and for material characterization, down to the nanometer scale.

Our Equipment: Environmental Scanning Electron Microscopy (ESEM): FEI Quanta 200

ESEM works at variable pressures, between high vacuum and atmospheric pressure, enabling wet (biological) and isolant samples analysis.

Morphologic imaging is given in secondary/backscatterd electrons and in catodoluminescence, with lateral resolution down to 4 nm. Chemical composition analysis and mapping are possible thanks to an energy dispersive X-Ray spectrometer.

For further information about our SEM services, please contact: cesar@unica.it

Dr. Marco Marceddu

phone: +39 070 675 6584, email: marco.marceddu@unica.it

Questionnaire and social

Share on:
Impostazioni cookie