An electronic coincidence system for "in frame" DAQ from a double microstrip silicon detector exposed to X-rays

BANDETTINI A.;BENCIVELLI W.;BERTOLUCCI E.;BOTTIGLI U.;CONTI M.;DEL GUERRA A.;FANTACCI M. E.;RANDACCIO, PAOLO;ROSSO V.;RUSSO P.;STEFANINI A.

1993-01-01