Reliability prediction and real world for LED lamps
MURA, GIOVANNA;VANZI, MASSIMO
2014-01-01
Abstract
The paper focuses on Reliability of Reliability Predictions by comparison with available Reliability Data Sheet and Accelerated Stress Test results on commercially available devices. The striking difference in the predicted MTTFs (Mean Time To Failure) is discussed.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.