Reliability prediction and real world for LED lamps

MURA, GIOVANNA;VANZI, MASSIMO
2014-01-01

Abstract

The paper focuses on Reliability of Reliability Predictions by comparison with available Reliability Data Sheet and Accelerated Stress Test results on commercially available devices. The striking difference in the predicted MTTFs (Mean Time To Failure) is discussed.
2014
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
978-147993909-1
IEEE (Institute of Electrical and Electronics Engineers, Inc.)
207
210
4
WOS:000361019000050
2-s2.0-84908483016
21th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2014
contributo
Esperti anonimi
30 Giugno - 4 Luglio 2014
Marina Bay SandsSingapore; Singapore
internazionale
no
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Mura, Giovanna; Vanzi, Massimo
273
2
4.1 Contributo in Atti di convegno
none
info:eu-repo/semantics/conferencePaper
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