A first generation x-ray microtomography system for non-destructive materials testing

BERTOLINO, FILIPPO;GATTO, GIANLUCA;GINESU, FRANCESCO;RANDACCIO, PAOLO
1996-01-01

Abstract

The purpose of this paper is to describe the prototype of a first generation X-ray microtomograph for the non-destructive testing of mechanical components. Following a brief presentation of the system, characterisation tests, the purpose of which is to highlight the system's limits and sphere of applicability, are discussed. Some significant results are then illustrated.
1996
Inglese
XXV AIAS NATIONAL CONFERENCE - INTERNATIONAL CONFERENCE ON MATERIAL ENGINEERING
ITALIA
423
429
7
XXV AIAS NATIONAL CONFERENCE - INTERNATIONAL CONFERENCE ON MATERIAL ENGINEERING
contributo
Comitato scientifico
4-7 SEPTEMBER 1996.
GALLIPOLI - LECCE (ITALY)
nazionale
scientifica
Tomography, Non-destructive testing
no
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Bertolino, Filippo; Gatto, Gianluca; Ginesu, Francesco; Randaccio, Paolo
273
4
4.1 Contributo in Atti di convegno
open
info:eu-repo/semantics/conferencePaper
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