UniCa Ateneo Docenti e ricercatori Ricerca Prodotti della Ricerca (IRIS)

Mostrati risultati da 1 a 50 di 117
Titolo Data di pubblicazione Autore(i) Rivista Editore
Laser Diode DC Measurement Protocols 1-gen-2021 Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G. - Elsevier
Identifying the lights position in photometric stereo under unknown lighting 1-gen-2021 Concas, A.; Dessi, R.; Fenu, C.; Rodriguez, G.; Vanzi, M. - Institute of Electrical and Electronics Engineers Inc.
Peculiar failure mechanisms in GaN power transistors 1-gen-2020 Vanzi, M.; Mura, G. MICROELECTRONICS RELIABILITY -
Optical gain in laser diodes with null reflectivity 1-gen-2019 Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. MICROELECTRONICS RELIABILITY -
Further improvements of an extended Hakki-Paoli method 1-gen-2018 Vanzi, M.; Mura, G.; Martines, G. MICROELECTRONICS RELIABILITY -
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1-gen-2018 Vanzi, M.; Mura, G.; SANNA VALLE, Valerio - SPIE
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1-gen-2018 Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno JOURNAL OF ELECTRONIC MATERIALS -
Extended Modal Gain Measurement in DFB Laser Diodes 1-gen-2017 Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L. IEEE PHOTONICS TECHNOLOGY LETTERS -
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1-gen-2017 Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M. - IEEE (Institute of Electrical and Electronics Engineers)
Practical optical gain by an extended Hakki-Paoli method 1-gen-2017 Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L. MICROELECTRONICS RELIABILITY -
Analysis of GaN based high-power diode lasers after singular degradation events 1-gen-2017 Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W. PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS -
Rilievo 3D non a contatto: tecniche speciali per l'arte rupestre 1-gen-2016 Mannu, Carla; Rodriguez, Giuseppe; Vanzi, Massimo - Condaghes
ESD tests on 850 nm GaAs-based VCSELs 1-gen-2016 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K. MICROELECTRONICS RELIABILITY -
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes 1-gen-2016 De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Gaudenzio; Zanoni, Enrico IEEE TRANSACTIONS ON NANOTECHNOLOGY -
Photometric stereo 3D visualizations of rock-art panels, bas-reliefs, and graffiti 1-gen-2016 Vanzi, Massimo; Emilio Bagnoli, Paolo; Mannu, Carla; Rodriguez, Giuseppe - Archaeopress Archaeology
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue 1-gen-2016 Mura, Giovanna; Vanzi, Massimo - Institute of Electrical and Electronics Engineers Inc.
Side-Mode Excitation in Single-Mode Laser Diodes 1-gen-2016 Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY -
Nuovi sviluppi nelle tecniche di stereofotometria 3D di incisioni e rilievi. Applicazioni nella tomba XV di Sos Furrighesos, Sardegna 1-gen-2015 Mannu, C; Rodriguez, Giuseppe; Tanda, Giuseppa; Vanzi, Massimo - Edizioni del Centro - Centro Camuno di Studi Preistorici
Clamp voltage and ideality factor in laser diodes 1-gen-2015 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni MICROELECTRONICS RELIABILITY -
Reliability issues in Optical Emitters 1-gen-2015 Vanzi, Massimo; Mura, Giovanna - IEEE Computer Society
Recent improvements in photometric stereo for rock art 3D imaging 1-gen-2015 Dessì, R; Mannu, C; Rodriguez, Giuseppe; Tanda, Giuseppa; Vanzi, Massimo DIGITAL APPLICATIONS IN ARCHAEOLOGY AND CULTURAL HERITAGE -
Proton irradiation effects on commercial laser diodes 1-gen-2015 Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro - Institute of Electrical and Electronics Engineers Inc.
Photometric stereo for 3D mapping of carvings and relieves: case studies on prehistorical art in Sardinia 1-gen-2014 Vanzi, Massimo; Mannu, C; Dessì, R; Rodriguez, Giuseppe; Tanda, Giuseppa ÂNGULO -
FIB-induced electro-optical alterations in a DFB InP laser diode 1-gen-2014 Mura, Giovanna; Vanzi, Massimo; Marcello, G. MICROELECTRONICS RELIABILITY -
Ideality factor and threshold voltage in laser diodes 1-gen-2014 Vanzi, Massimo; Mura, Giovanna; Marcello, G. - -
Reliability prediction and real world for LED lamps 1-gen-2014 Mura, Giovanna; Vanzi, Massimo - IEEE (Institute of Electrical and Electronics Engineers, Inc.)
Faulty failure analyses 1-gen-2013 Mura, Giovanna; Vanzi, Massimo - IEEE
XEBIC at the Dual Beam 1-gen-2013 Vanzi, Massimo; Podda, Simona; Musu, E; Cao, R. MICROELECTRONICS RELIABILITY -
The role of the optical trans-characteristics in laser diode analysis 1-gen-2013 Mura, Giovanna; Vanzi, Massimo; Marcello, G.; Cao, R. MICROELECTRONICS RELIABILITY -
“Hot-plugging” of led modules: electrical characterization and device degradation 1-gen-2013 Dal Lago, M; Meneghini, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Meneghesso, G; Zanoni, E. MICROELECTRONICS RELIABILITY -
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 1-gen-2013 Compagnin, A; Meneghini, M; Barbato, M; Giliberto, V; Cester, A; Vanzi, Massimo; Mura, Giovanna; Zanoni, E; Meneghesso, G. MICROELECTRONICS RELIABILITY -
Optical losses in single-mode laser diodes 1-gen-2013 Vanzi, Massimo; Mura, Giovanna; Marongiu, M.; Tomasi, T. MICROELECTRONICS RELIABILITY -
External cavity ITLA degradation 1-gen-2012 Mura, Giovanna; Vanzi, Massimo; Martines, Giovanni; T., Tomasi; R., Cao; M., Marongiu - -
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1-gen-2012 M., Meneghini; M., Bertin; G., dal Santo; A., Stocco; A., Chini; D., Marcon; P. E., Malinowski; Mura, Giovanna; E., Musu; Vanzi, Massimo; G., Meneghesso; E., Zanoni - -
Chip and package-related degradation of high power white LEDs 1-gen-2012 Meneghini, M; Dal Lago, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Menegnesso, G; Zanoni, E. MICROELECTRONICS RELIABILITY -
Phosphors for LED-based light sources: Thermal properties and reliability issues 1-gen-2012 Dal Lago, M; Meneghini, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Meneghesso, G; Zanoni, E. MICROELECTRONICS RELIABILITY -
Implementation of TV-rate EBIC at a Dual BEam 1-gen-2011 Vanzi, Massimo; Podda, Simona; Tatti, F. - -
An original DoE-based tool for silicon photodetectors EoL estimation in space environments 1-gen-2011 Vanzi, Massimo; Spezzigu, P; Bechou, L; Quadri, G; Gilard, O; Ousten, Y. MICROELECTRONICS RELIABILITY Elsevier
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics 1-gen-2011 Vanzi, Massimo; Podda, Simona - Elisabetta Falcieri
DC parameters for laser diodes from experimental curves 1-gen-2011 Vanzi, Massimo; Mura, Giovanna; Martines, Giovanni MICROELECTRONICS RELIABILITY Elsevier
Prediction of Phototransistor Spectral Responsivity Degradation in a Space Environment using DOE methodology 1-gen-2010 Spezzigu, P; L., Bechou; G., Quadri; O., Gilard; C., Caddeo; Y., Ousten; Vanzi, Massimo - -
Optimized "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment 1-gen-2010 Quadri, G; P., Spezzigu; C., Caddeo; O., Gilard; L., Bechou; Vanzi, Massimo - -
3D reconstruction of FIB microstructures by Photometric Stereo at the SEM 1-gen-2010 S., Podda; R., Pintus; E., Musu; Vanzi, Massimo - Royal microscopy society
Faulty Failure Analyses 1-gen-2010 Mura, Giovanna; Vanzi, Massimo - -
3D reconstruction of FIB microstructures from BSE images 1-gen-2010 Podda, Simona; R., Pintus; E., Musu; Vanzi, Massimo - -
Degradation mechanisms of white LEDs for lighting applications 1-gen-2010 M., Meneghini; M., DAL LAGO; L., Rodighiero; Mura, Giovanna; Vanzi, Massimo; G., Meneghesso - -
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis 1-gen-2010 Mura, Giovanna; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
Customized and highly reliable channel phototransistor array for aerospace optical encoders 1-gen-2009 M., Bregoli; A., Maglione; A., Collini; P., Bellutti; P., Spezzigu; L., Bechou; Vanzi, Massimo - -
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices 1-gen-2009 Mura, Giovanna; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
Trapped mobile charges effects on electrooptical performances in silicon phototransistors for space applications 1-gen-2009 P., Spezzigu; G., Quadri; O., Gilard; L., Bechou; Y., Ousten; Vanzi, Massimo - -
Mostrati risultati da 1 a 50 di 117
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