A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters

MARTINES, GIOVANNI;
1991-01-01
1991
Inglese
Modulation-Doped Field-Effect Transistors: applications and circuits
H. DAEMBKES
28
34
7
info:eu-repo/semantics/bookPart
2.1 Contributo in volume (Capitolo o Saggio)
Martines, Giovanni; M., Sannino
2 Contributo in Volume::2.1 Contributo in volume (Capitolo o Saggio)
2
268
none
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