Using a porous matrix to study, characterize and recover damaged signal after focused ion beam cutting

M. Tiddia
;G. Mula;I. Gilmore
2018-01-01
2018
Inglese
PSST 2018
porous Semiconductors Science and Technology 2018
Contributo
Comitato scientifico
11-16 marzo 2018
LA GRANDE MOTTE, FRANCIA
internazionale
scientifica
sì
274
Tiddia, M.; Mula, G.; Mihara, I.; Havelund, R.; Gilmore, I.
4.2 Abstract in Atti di convegno
4 Contributo in Atti di Convegno (Proceeding)::4.2 Abstract in Atti di convegno
5
info:eu-repo/semantics/conferenceObject
none
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