A simpler method for life-testing laser diodes

VANZI, MASSIMO;MARTINES, GIOVANNI;BONFIGLIO, ANNALISA;
1999-01-01
1999
Inglese
Proceedings 10th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
0-08-043420-7
Elsevier science
OXFORD
MICROELECTRONICS RELIABILITY
39
1067
1071
5
ESREF '99
Sì, ma tipo non specificato
5-8 October 1999
Bordeaux, France
internazionale
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Vanzi, Massimo; Martines, Giovanni; Bonfiglio, Annalisa; Licheri, M; Darco, R; Salmini, G; DE PALO, R.
273
7
4.1 Contributo in Atti di convegno
none
info:eu-repo/semantics/conferenceObject
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