Statistical modeling of pseudomorphic HEMTs from automated noise and scattering parameter measurements

MARTINES, GIOVANNI;
1993-01-01
1993
Inglese
Proceedings IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, 1993
0-7803-0894-8
Cornell University
ITHACA (NY)
212
218
7
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Caddemi, A; Martines, Giovanni; Sannino, M.
273
3
4.1 Contributo in Atti di convegno
none
info:eu-repo/semantics/conferenceObject
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