A new automated test-set for the characterization of low-noise devices in terms of noise, gain and scattering parameters

MARTINES, GIOVANNI;
1990-01-01
1990
Inglese
Proceedings 4th Microwaves and Optronics Conference
275
280
6
MIOP '90
24-26 april 1990
Stuttgart, Germany
internazionale
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Garbo, G; Martines, Giovanni; Sannino, M.
273
3
4.1 Contributo in Atti di convegno
none
info:eu-repo/semantics/conferenceObject
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