Charge diffusion and reciprocity theorems: A direct approach to EBIC of ridge laser diodes

MARTINES, GIOVANNI;VANZI, MASSIMO
1996-01-01
1996
Proceedings of the 22nd International Symposium for Testing and Failure Analysis
0871705826
Materials Park
233
238
6
ISTFA (International Symposium on Testing and Failure Analysis)
18-22 November 1996
Los Angeles, California, USA
internazionale
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
F., Magistrali; G., Salmini; Martines, Giovanni; Vanzi, Massimo
273
4
4.1 Contributo in Atti di convegno
none
info:eu-repo/semantics/conferenceObject
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