University of Cagliari
Giovanna Mura
Electronic Components Authentication via Physical Analysis
2023-01-01 Mura, G.; Carta, S.; Ricci, P. C.; Martines, G.
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films
2023-01-01 Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells
2023-01-01 Nicoletto, M.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Mura, G.; Rossi, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant
2023-01-01 Caria, A; Fraccaroli, R; Pierobon, G; Castellaro, T; Mura, G; Ricci, Pc; De Santi, C; Buffolo, M; Trivellin, N; Zanoni, E; Meneghesso, G; Meneghini, M
Reliability risks from counterfeit electronics
2022-01-01 Mura, Giovanna; Martines, Giovanni
Laser Diode DC Measurement Protocols
2021-01-01 Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G.
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms
2021-01-01 Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH
2021-01-01 Mura, Giovanna; Fois, Gabriele
Laser Diode Reliability
2021-01-01 Mura, Giovanna
Analysis of Fake Amplifiers
2021-01-01 Mura, G.; Murru, R.; Martines, G.
CdTe solar cells: technology, operation and reliability
2021-01-01 Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G.
Peculiar failure mechanisms in GaN power transistors
2020-01-01 Vanzi, M.; Mura, G.
Analysis of counterfeit electronics
2020-01-01 Mura, G.; Murru, R.; Martines, G.
New paradigm for EBIC amplifier on FIB X-section
2019-01-01 SANNA VALLE, Valerio; Perez, Guy; Bascoul, Guillaume; Chauvin, Helene; Viallet, Benoît; Mura, Giovanna; Apeddu, GIAN PAOLO
Optical gain in laser diodes with null reflectivity
2019-01-01 Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y.
Reliability concerns from the gray market
2018-01-01 Mura, Giovanna
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices
2018-01-01 Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes
2018-01-01 Vanzi, M.; Mura, G.; SANNA VALLE, Valerio
From automotive to space qualification: Overlaps, gaps and possible convergence
2018-01-01 Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G.
Further improvements of an extended Hakki-Paoli method
2018-01-01 Vanzi, M.; Mura, G.; Martines, G.
Practical optical gain by an extended Hakki-Paoli method
2017-01-01 Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L.
Extended Modal Gain Measurement in DFB Laser Diodes
2017-01-01 Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L.
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities
2017-01-01 Enrici Vaion, R.; Medda, M.; Mancaleoni, A.; Mura, G.; Pintus, A.; De Tomasi, M.
Analysis of GaN based high-power diode lasers after singular degradation events
2017-01-01 Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W.
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers
2017-01-01 Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M.
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs
2017-01-01 Mura, G.; MIRANDA CASTELLANO, ENRIQUE ALBERTO
Reverse bias degradation of metal wrap through silicon solar cells
2016-01-01 Barbato, M.; Barbato, A.; Meneghini, M.; Cester, A.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cellere, G.; Meneghesso, G.
Side-Mode Excitation in Single-Mode Laser Diodes
2016-01-01 Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna
ESD tests on 850 nm GaAs-based VCSELs
2016-01-01 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K.
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes
2016-01-01 De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Gaudenzio; Zanoni, Enrico
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue
2016-01-01 Mura, Giovanna; Vanzi, Massimo
Single Event Transient acquisition and mapping for space device Characterization
2016-01-01 Pilia, Roberta; Bascoul, Guillaume; Sanchez, Kevin; Mura, Giovanna; Infante, Fulvio
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells
2015-01-01 Barbato, M.; Meneghini, M.; Cester, A.; Barbato, A.; Zanoni, E.; Meneghesso, G.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cellere, G.
Clamp voltage and ideality factor in laser diodes
2015-01-01 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni
Proton irradiation effects on commercial laser diodes
2015-01-01 Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro
Reliability issues in Optical Emitters
2015-01-01 Vanzi, Massimo; Mura, Giovanna
Degradation mechanisms and lifetime of state-of-the-art green laser diodes
2015-01-01 Marioli, M; Meneghini, M; Rossi, F; Salviati, G; de Santi, C; Mura, Giovanna; Meneghesso, G; Zanoni, E.
Reliability prediction and real world for LED lamps
2014-01-01 Mura, Giovanna; Vanzi, Massimo
Ideality factor and threshold voltage in laser diodes
2014-01-01 Vanzi, Massimo; Mura, Giovanna; Marcello, G.
Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress
2014-01-01 Meneghini, M; Carraro, S; Meneghesso, G; Trivellin, N; Mura, Giovanna; Rossi, F; Salviati, G; Holc, K; Weig, T; Schade, L; Karunakaran, M; Wagner, J; Schwarz U., T; Zanoni, E.
FIB-induced electro-optical alterations in a DFB InP laser diode
2014-01-01 Mura, Giovanna; Vanzi, Massimo; Marcello, G.
Influence of shunt resistance on the performance of an illuminated string of solar cells: Theory, simulation, and experimental analysis
2014-01-01 Barbato, M.; Meneghini, M; Cester, A; Mura, Giovanna; Zanoni, E; Meneghesso, G.
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells
2013-01-01 Compagnin, A; Meneghini, M; Barbato, M; Giliberto, V; Cester, A; Vanzi, Massimo; Mura, Giovanna; Zanoni, E; Meneghesso, G.
Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi
2013-01-01 Musu, E.; Mura, Giovanna; Ligios, G.; Delogu, Francesco
“Hot-plugging” of led modules: electrical characterization and device degradation
2013-01-01 Dal Lago, M; Meneghini, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Meneghesso, G; Zanoni, E.
Early stages of the mechanical alloying of TiC-TiN powder mixtures
2013-01-01 Mura, Giovanna; Musu, E; Delogu, Francesco
Faulty failure analyses
2013-01-01 Mura, Giovanna; Vanzi, Massimo
Optical losses in single-mode laser diodes
2013-01-01 Vanzi, Massimo; Mura, Giovanna; Marongiu, M.; Tomasi, T.
The role of the optical trans-characteristics in laser diode analysis
2013-01-01 Mura, Giovanna; Vanzi, Massimo; Marcello, G.; Cao, R.
Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence
2013-01-01 M., Meneghini; S., Carraro; G., Meneghesso; N., Trivellin; Mura, Giovanna; F., Rossi; G., Salviati; K., Holc; T., Weig; L., Schade; M. A., Karunakaran; J., Wagner; U. T., Schwarz; AND E., Zanoni
| Title | Issue Date | Author(s) | Journal | Publisher |
|---|---|---|---|---|
| Electronic Components Authentication via Physical Analysis | 1-Jan-2023 | Mura, G.; Carta, S.; Ricci, P. C.; Martines, G. | - | - |
| A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films | 1-Jan-2023 | Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M. | IEEE ACCESS | - |
| Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells | 1-Jan-2023 | Nicoletto, M.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Mura, G.; Rossi, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M. | IEEE JOURNAL OF PHOTOVOLTAICS | - |
| Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant | 1-Jan-2023 | Caria, A; Fraccaroli, R; Pierobon, G; Castellaro, T; Mura, G; Ricci, Pc; De Santi, C; Buffolo, M; Trivellin, N; Zanoni, E; Meneghesso, G; Meneghini, M | MICROELECTRONICS RELIABILITY | - |
| Reliability risks from counterfeit electronics | 1-Jan-2022 | Mura, Giovanna; Martines, Giovanni | - | IEEE |
| Laser Diode DC Measurement Protocols | 1-Jan-2021 | Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G. | - | Elsevier |
| Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms | 1-Jan-2021 | Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter | - | - |
| CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH | 1-Jan-2021 | Mura, Giovanna; Fois, Gabriele | - | AIT Series Trends in earth observation Volume 2 |
| Laser Diode Reliability | 1-Jan-2021 | Mura, Giovanna | - | ISTE Press Ltd. - Elsevier |
| Analysis of Fake Amplifiers | 1-Jan-2021 | Mura, G.; Murru, R.; Martines, G. | - | IEEE |
| CdTe solar cells: technology, operation and reliability | 1-Jan-2021 | Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G. | JOURNAL OF PHYSICS D. APPLIED PHYSICS | - |
| Peculiar failure mechanisms in GaN power transistors | 1-Jan-2020 | Vanzi, M.; Mura, G. | MICROELECTRONICS RELIABILITY | - |
| Analysis of counterfeit electronics | 1-Jan-2020 | Mura, G.; Murru, R.; Martines, G. | MICROELECTRONICS RELIABILITY | - |
| New paradigm for EBIC amplifier on FIB X-section | 1-Jan-2019 | SANNA VALLE, Valerio; Perez, Guy; Bascoul, Guillaume; Chauvin, Helene; Viallet, Benoît; Mura, Giovanna; Apeddu, GIAN PAOLO | - | - |
| Optical gain in laser diodes with null reflectivity | 1-Jan-2019 | Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. | MICROELECTRONICS RELIABILITY | - |
| Reliability concerns from the gray market | 1-Jan-2018 | Mura, Giovanna | MICROELECTRONICS RELIABILITY | - |
| Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices | 1-Jan-2018 | Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno | JOURNAL OF ELECTRONIC MATERIALS | - |
| Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes | 1-Jan-2018 | Vanzi, M.; Mura, G.; SANNA VALLE, Valerio | - | SPIE |
| From automotive to space qualification: Overlaps, gaps and possible convergence | 1-Jan-2018 | Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G. | - | IEEE (Institute of Electrical and Electronics Engineers) |
| Further improvements of an extended Hakki-Paoli method | 1-Jan-2018 | Vanzi, M.; Mura, G.; Martines, G. | MICROELECTRONICS RELIABILITY | - |
| Practical optical gain by an extended Hakki-Paoli method | 1-Jan-2017 | Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L. | MICROELECTRONICS RELIABILITY | - |
| Extended Modal Gain Measurement in DFB Laser Diodes | 1-Jan-2017 | Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L. | IEEE PHOTONICS TECHNOLOGY LETTERS | - |
| Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities | 1-Jan-2017 | Enrici Vaion, R.; Medda, M.; Mancaleoni, A.; Mura, G.; Pintus, A.; De Tomasi, M. | MICROELECTRONICS RELIABILITY | - |
| Analysis of GaN based high-power diode lasers after singular degradation events | 1-Jan-2017 | Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W. | PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS | - |
| Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers | 1-Jan-2017 | Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M. | - | IEEE (Institute of Electrical and Electronics Engineers) |
| Analytical model for the I-V characteristics of fresh and degraded commercial LEDs | 1-Jan-2017 | Mura, G.; MIRANDA CASTELLANO, ENRIQUE ALBERTO | - | - |
| Reverse bias degradation of metal wrap through silicon solar cells | 1-Jan-2016 | Barbato, M.; Barbato, A.; Meneghini, M.; Cester, A.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cellere, G.; Meneghesso, G. | SOLAR ENERGY MATERIALS AND SOLAR CELLS | - |
| Side-Mode Excitation in Single-Mode Laser Diodes | 1-Jan-2016 | Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | - |
| ESD tests on 850 nm GaAs-based VCSELs | 1-Jan-2016 | Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K. | MICROELECTRONICS RELIABILITY | - |
| Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes | 1-Jan-2016 | De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Gaudenzio; Zanoni, Enrico | IEEE TRANSACTIONS ON NANOTECHNOLOGY | - |
| Logics of Failure Analysis: 20 Years of rules of the Rue Morgue | 1-Jan-2016 | Mura, Giovanna; Vanzi, Massimo | - | Institute of Electrical and Electronics Engineers Inc. |
| Single Event Transient acquisition and mapping for space device Characterization | 1-Jan-2016 | Pilia, Roberta; Bascoul, Guillaume; Sanchez, Kevin; Mura, Giovanna; Infante, Fulvio | MICROELECTRONICS RELIABILITY | - |
| Stress-induced instabilities of shunt paths in high efficiency MWT solar cells | 1-Jan-2015 | Barbato, M.; Meneghini, M.; Cester, A.; Barbato, A.; Zanoni, E.; Meneghesso, G.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cellere, G. | - | - |
| Clamp voltage and ideality factor in laser diodes | 1-Jan-2015 | Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni | MICROELECTRONICS RELIABILITY | - |
| Proton irradiation effects on commercial laser diodes | 1-Jan-2015 | Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro | - | Institute of Electrical and Electronics Engineers Inc. |
| Reliability issues in Optical Emitters | 1-Jan-2015 | Vanzi, Massimo; Mura, Giovanna | - | IEEE Computer Society |
| Degradation mechanisms and lifetime of state-of-the-art green laser diodes | 1-Jan-2015 | Marioli, M; Meneghini, M; Rossi, F; Salviati, G; de Santi, C; Mura, Giovanna; Meneghesso, G; Zanoni, E. | PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE | - |
| Reliability prediction and real world for LED lamps | 1-Jan-2014 | Mura, Giovanna; Vanzi, Massimo | - | IEEE (Institute of Electrical and Electronics Engineers, Inc.) |
| Ideality factor and threshold voltage in laser diodes | 1-Jan-2014 | Vanzi, Massimo; Mura, Giovanna; Marcello, G. | - | - |
| Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress | 1-Jan-2014 | Meneghini, M; Carraro, S; Meneghesso, G; Trivellin, N; Mura, Giovanna; Rossi, F; Salviati, G; Holc, K; Weig, T; Schade, L; Karunakaran, M; Wagner, J; Schwarz U., T; Zanoni, E. | - | SPIE, the international society for optics and photonics |
| FIB-induced electro-optical alterations in a DFB InP laser diode | 1-Jan-2014 | Mura, Giovanna; Vanzi, Massimo; Marcello, G. | MICROELECTRONICS RELIABILITY | - |
| Influence of shunt resistance on the performance of an illuminated string of solar cells: Theory, simulation, and experimental analysis | 1-Jan-2014 | Barbato, M.; Meneghini, M; Cester, A; Mura, Giovanna; Zanoni, E; Meneghesso, G. | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | - |
| Thermal and electrical investigation of the reverse bias degradation of silicon solar cells | 1-Jan-2013 | Compagnin, A; Meneghini, M; Barbato, M; Giliberto, V; Cester, A; Vanzi, Massimo; Mura, Giovanna; Zanoni, E; Meneghesso, G. | MICROELECTRONICS RELIABILITY | - |
| Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi | 1-Jan-2013 | Musu, E.; Mura, Giovanna; Ligios, G.; Delogu, Francesco | JOURNAL OF ALLOYS AND COMPOUNDS | - |
| “Hot-plugging” of led modules: electrical characterization and device degradation | 1-Jan-2013 | Dal Lago, M; Meneghini, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Meneghesso, G; Zanoni, E. | MICROELECTRONICS RELIABILITY | - |
| Early stages of the mechanical alloying of TiC-TiN powder mixtures | 1-Jan-2013 | Mura, Giovanna; Musu, E; Delogu, Francesco | MATERIALS CHEMISTRY AND PHYSICS | - |
| Faulty failure analyses | 1-Jan-2013 | Mura, Giovanna; Vanzi, Massimo | - | IEEE |
| Optical losses in single-mode laser diodes | 1-Jan-2013 | Vanzi, Massimo; Mura, Giovanna; Marongiu, M.; Tomasi, T. | MICROELECTRONICS RELIABILITY | - |
| The role of the optical trans-characteristics in laser diode analysis | 1-Jan-2013 | Mura, Giovanna; Vanzi, Massimo; Marcello, G.; Cao, R. | MICROELECTRONICS RELIABILITY | - |
| Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence | 1-Jan-2013 | M., Meneghini; S., Carraro; G., Meneghesso; N., Trivellin; Mura, Giovanna; F., Rossi; G., Salviati; K., Holc; T., Weig; L., Schade; M. A., Karunakaran; J., Wagner; U. T., Schwarz; AND E., Zanoni | APPLIED PHYSICS LETTERS | - |
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