Giovanna Mura received the PhD. Degree in Electronic Engineering and Computer Science from the University of Cagliari, Italy, in 2004. Since 2012, she is Assistant Professor in the Department of Electric and Electronic Engineering, University of Cagliari. She teaches “Reliability of electronic systems” and “Diagnostic of electronic devices” in the MSc courses on Electronic Engineering.

Her research activity is mainly focused on failure physics, diagnostics of  microelectronics, reliability in harsh environments (automotive, space applications..). Her current research interests include the physical detection of counterfeit electronics.

Since 2012, she has been involved in the TPC of several editions of the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF). She is author of more than 70 papers published on international journals or presented in international conferences. She is a member of the IEEE Reliability Society.

She was recipient of the Best Paper Award at the ESREF 2016 and 2018

Invited talks

(2020) – (Cancelled) Summer School of Information Engineering – “Silvano Pupolin”- invited speaker Title: “Towards zero-failure electronic systems: the importance of diagnostics”.

(2020) Aldo Armigliato SEM School in Materials Science- invited speaker Title: “SEM Applications in Device Diagnostics”

(2019) IPFA 2019 exchange paper (not speaker) (2019) Aldo Armigliato SEM School in Materials Science- invited speaker  Title: “Scanning Electron Microscopy in Failure Analysis”

(2018) IPFA 2018- invited speaker  Title: “From Automotive to Space qualification: Overlaps, gaps and possible convergence”

(2018) ISTFA 2018 exchange paper (not speaker) Title: Single event transient acquisition and mapping for space device characterization”

(2018) SIE 2018 PhD school- invited speaker Title: “Diagnostics of electron devices: a real shortcut to reliability improvements”

(2018) MRS 2018- EP04 – invited speaker Title: “Diagnostics of electron devices: Fundamentals and Logics”

(2017) School of Scanning Electron Microscopy in Materials Science – invited speaker Title: “SEM Applications in Device Diagnostics”

(2017) ESREF 2017 invited paper (not speaker) Title: “Qualification Extension of Automotive Smart Power and Digital ICs to Harsh Aerospace Mission Profiles: Gaps and Opportunities”

(2016) IPFA 2016 invited speaker  Title: “Logics of Failure Analysis: 20 years of Rules of the Rue Morgue”

(2016) PhD Summer School “Italo Gorini” – invited speaker  Title: “Life Time measurements in Electron Devices and Systems”

(2015) School of Scanning Electron Microscopy on nanostructured materials and innovative applications-  invited speaker Title: “Photometric Stereo at the SEM. Application to microelectronics”