Doping-dependent band structure of LaAlO3/SrTiO3 interfaces by soft x-ray polarization-controlled resonant angle-resolved photoemission
FILIPPETTI, ALESSIO;FIORENTINI, VINCENZO
2014-01-01
Abstract
olarization-controlled synchrotron radiation was used to map the electronic structure of buried conducting interfaces of LaAlO3/SrTiO3 in a resonant angle-resolved photoemission experiment. A strong polarization dependence of the Fermi surface and band dispersions is demonstrated, highlighting different Ti 3d orbitals involved in two-dimensional (2D) conduction. Measurements on samples with different doping levels reveal dif- ferent band occupancies and Fermi-surface areas. The photoemission results are directly compared with advanced first-principles calculations, carried out for different 3d-band filling levels connected with the 2D mobile carrier concentrations obtained from transport measurements, with indication of charge localization at the interface.Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.