Characterisation of an X-Ray System with GaAs Detector for Composite Material Analysis

BERTOLINO, FILIPPO;GATTO, GIANLUCA;GINESU, FRANCESCO;RANDACCIO, PAOLO
1998-01-01

Abstract

Here a first X-ray microtomograph for analysing defects in composite materials is described and characterised. After a brief presentation of the system, the characterisation tests conducted to assess its efficiency are discussed.
1998
Inglese
Key Engineering Materials
1013-9826
1998 Trans Tech Publications
SVIZZERA
KEY ENGINEERING MATERIALS
144
261
270
10
Third Seminar on Experimental Techniques and Design in Composite Materials
contributo
Comitato scientifico
30-31 October 1996
Cagliari, Italy.
internazionale
scientifica
Microtomography, Defect Analysis.
no
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Bertolino, Filippo; Gatto, Gianluca; Ginesu, Francesco; Randaccio, Paolo
273
4
1.1 Articolo in rivista
reserved
info:eu-repo/semantics/conferencePaper
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