Advanced Materials Characterization by means of Moirè Techniques

AYMERICH, FRANCESCO;GINESU, FRANCESCO;
1991-01-01
1991
Inglese
Proceedings SPIE Vol. 1554B
PROCEEDINGS OF SPIE
1554B
304
314
11
WOS:A1991BV11E00036
2-s2.0-85076173557
2nd International Conference on Photomechanics and Speckle Metrology
contributo
21-26 Luglio 1991
San Diego
internazionale
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Aymerich, Francesco; Ginesu, Francesco; Priolo, P.
273
3
4.1 Contributo in Atti di convegno
none
info:eu-repo/semantics/conferenceObject
Files in This Item:
There are no files associated with this item.

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Questionnaire and social

Share on:
Impostazioni cookie