XPS and ARXPS for Characterizing Multilayers of Silanes on Gold Surfaces

Casula, Giulio

First

;Fantauzzi, Marzia;Elsener, Bernhard;Rossi, Antonella

2024-01-01

---

Abstract

X-ray photoelectron spectroscopy (XPS) and angle-resolved XPS (ARXPS) characterization of surface layers resulting from the functionalization of polymers such as polyvinylchloride (PVC) modified with 3(mercaptopropyl)-trimethoxysilane (MPTMS) and (3-aminopropyl) triethoxysilane (APTES) is challenging due to the overlap in signals, deriving both from the substrate and the functionalized layers. In this work, a freshly cleaved, ideally flat gold surface was used as carbon-free model substrate functionalized with MPTMS and subsequently grafted with APTES. Avoiding the overlap of signals from carbon atoms present in the substrate, the signals in the C1s, O1s, Si2p, S2p and N1s high-resolution spectra could be assigned to the MPTMS/APTES functionalized layer only and the curve-fitting parameters could be determined. Quantitative analysis was in very good agreement with the expected stoichiometry of the functionalized layer, confirming the adopted curve-fitting procedure. In addition, it was found that one molecule of APTES grafted two MPTMS via silane groups. ARXPS allowed for determining the thickness of the functionalized layers: MPTMS thickness was found to be 0.5 (0.2) nm, whereas MPTMS + APTES thickness 1.0 (0.2) nm was in good agreement with Avogadro model calculations. This approach can be considered a powerful tool for characterizing functionalized surfaces of more complex systems by XPS.