Electronic Components Authentication via Physical Analysis

Mura G.
First
;Carta S.;Ricci P. C.;Martines G.
2023-01-01
2023
Inglese
2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023
979-8-3503-4776-0
4
4
2-s2.0-85181200655
2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023
Esperti anonimi
16- 18 October 2023
Nis, Serbia
scientifica
no
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Mura, G.; Carta, S.; Ricci, P. C.; Martines, G.
273
4
4.1 Contributo in Atti di convegno
none
info:eu-repo/semantics/conferencePaper
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