Laser Diode Reliability

Mura Giovanna
Co-prime
2021-01-01
2021
978-1-78548-154-3
Semiconductor laser, Degradation mechanism, Optical system, Optical device, Reliability, Catastrophic Optical Damage (COD), COD-induced higher-order lateral mode, lateral-mode induced COD, Electrostatic Disharge (ESD), S-TEM analysis
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