Laser Diode Reliability

Mura Giovanna
Co-prime
2021-01-01
2021
Inglese
Advanced Laser Diode Reliability
Mitsuo Fukuda and Giovanna Mura
Massimo Vanzi, Laurent Béchou, Mitsuo Fukuda, Giovanna Mura
1
49
49
ISTE Press Ltd. - Elsevier
London- United Kingdom
978-1-78548-154-3
2-s2.0-85129104082
https://www.sciencedirect.com/science/article/pii/B978178548154350001X
Comitato scientifico
internazionale
scientifica
Semiconductor laser, Degradation mechanism, Optical system, Optical device, Reliability, Catastrophic Optical Damage (COD), COD-induced higher-order lateral mode, lateral-mode induced COD, Electrostatic Disharge (ESD), S-TEM analysis
sì
info:eu-repo/semantics/bookPart
2.1 Contributo in volume (Capitolo o Saggio)
Mura, Giovanna
2 Contributo in Volume::2.1 Contributo in volume (Capitolo o Saggio)
1
268
none
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