An original DoE-based tool for silicon photodetectors EoL estimation in space environments

VANZI, MASSIMO;
2011-01-01

Abstract

In our previous works we have demonstrated that Design of Experiments (DoE) is an innovative methodology defining optimized irradiation test plan and particularly valuable for the space qualification of silicon photodetectors. In particular, it provided us with the degradation model of photocurrent, darkness current, and spectral responsivity of silicon based phototransistors arrays with respect to the Total Ionizing Dose (TID) and to the Displacement Damage Dose (DDD), over a wide range of space-mission profiles. In this paper, we will summarize at first main results obtained thanks to the DoE methodology. Then we present how we can easily obtain, by exploiting DoE collected data, End-of-Life predictions of such devices with a reduced number of experiments, with a small batch of devices, and in relatively short time.
2011
Inglese
Proceedings of the 22th European Symposium on the RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS
Elsevier
Nathalie Labat, François Marc
51
9-11
1999
2003
5
22th European Symposium on the RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS
Esperti anonimi
3rd - 7th October 2011
Bordeaux, France
scientifica
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Vanzi, Massimo; Spezzigu, P; Bechou, L; Quadri, G; Gilard, O; Ousten, Y.
273
6
1.1 Articolo in rivista
none
info:eu-repo/semantics/conferenceObject
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