Practical optical gain by an extended Hakki-Paoli method

Vanzi, M.;Mura, G.;
2017-01-01

Abstract

The revision of the classic Hakki-Paoli method shows that the a priori knowledge of facet reflectivity and confinement factor is not required for measuring optical gain in semiconductor laser and LED emitters. Moreover, a recently proposed new formula for gain as a function of the applied voltage, combined with that method, allows for calculating the relevant parameters of the gain function by the sole sub-threshold spectral data. This avoids the known critical problems issued by instrument resolution on spectral data from the above-threshold domain. Moreover, this last chance allows for complete gain measurement also in degraded devices, when they do no more display any laser threshold, and then for including optical gain among the relevant parameters for monitoring device degradation.
2017
Inglese
76-77
579
583
5
https://www.sciencedirect.com/science/article/pii/S002627141730344X?via%3Dihub
Esperti anonimi
internazionale
scientifica
Laser diode; Optical gain; Electronic, Optical and Magnetic Materials; Atomic and Molecular Physics, and Optics; Condensed Matter Physics; Safety, Risk, Reliability and Quality; Surfaces, Coatings and Films; Electrical and Electronic Engineering
Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L.
1.1 Articolo in rivista
info:eu-repo/semantics/article
1 Contributo su Rivista::1.1 Articolo in rivista
262
7
reserved
Files in This Item:
File Size Format  
Microelectronics Reliability_76-77_2017.pdf

Solo gestori archivio

Description: articolo
Type: versione editoriale
Size 676.31 kB
Format Adobe PDF
676.31 kB Adobe PDF & nbsp; View / Open   Request a copy

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Questionnaire and social

Share on:
Impostazioni cookie