Clamp voltage and ideality factor in laser diodes

VANZI, MASSIMO;MURA, GIOVANNA;MARCELLO, GIULIA;MARTINES, GIOVANNI
2015-01-01
2015
Inglese
MICROELECTRONICS RELIABILITY
55
9-10
1736
1740
5
WOS:000364256400088
2-s2.0-84943448544
Esperti anonimi
internazionale
scientifica
no
Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni
1.1 Articolo in rivista
info:eu-repo/semantics/article
1 Contributo su Rivista::1.1 Articolo in rivista
262
4
reserved
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