Faulty failure analyses

MURA, GIOVANNA;VANZI, MASSIMO
2013-01-01
2013
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
978-147991241-4
IEEE
599
602
4
WOS:000329045700116
2-s2.0-84885656009
2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2013
contributo
Esperti anonimi
15-19 Luglio 2013
Suzhou; China
internazionale
isbn: 1424402069 ??
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Mura, Giovanna; Vanzi, Massimo
273
2
4.1 Contributo in Atti di convegno
none
info:eu-repo/semantics/conferenceObject
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