Importance of disorder in very high quality semiconductor microcavities

Saba, M.;QUOCHI, FRANCESCO;BONGIOVANNI, GIOVANNI LUIGI CARLO;MURA, ANTONIO ANDREA
2000-01-01
2000
178
149
153
5
Sì, ma tipo non specificato
Saba, M.; Quochi, Francesco; Oesterle, U.; Staehli, J. L.; Deveaud, B.; Bongiovanni, GIOVANNI LUIGI CARLO; Mura, ANTONIO ANDREA
1.1 Articolo in rivista
info:eu-repo/semantics/article
1 Contributo su Rivista::1.1 Articolo in rivista
262
7
none
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