A first generation x-ray microtomography system for non-destructive materials testing
BERTOLINO, FILIPPO;GATTO, GIANLUCA;GINESU, FRANCESCO;RANDACCIO, PAOLO
1996-01-01
Abstract
The purpose of this paper is to describe the prototype of a first generation X-ray microtomograph for the non-destructive testing of mechanical components. Following a brief presentation of the system, characterisation tests, the purpose of which is to highlight the system's limits and sphere of applicability, are discussed. Some significant results are then illustrated.File | Dimensione | Formato | |
---|---|---|---|
Aias96_1.pdf accesso aperto
Descrizione: Articolo principale
Tipologia: versione editoriale
Dimensione 314.35 kB
Formato Adobe PDF
|
314.35 kB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.