Interface structure and defects of silicon nanocrystals embedded into a-SiO(2)

IPPOLITO, MARIELLA;COLOMBO, LUCIANO
2008-01-01

Abstract

By means of large-scale atomistic simulations, we identity and characterize several kinds of bonding and coordination defects at the interface between a silicon nanoparticle and an embedding amorphous silicon dioxide matrix. In particular, we prove that interface bond defects are easily formed, while no Si-O double bond is observed. We conclude that optical properties, e.g., photoluminescence, are more likely due to such interface bond structures. Temperature effects on defect population and nature are discussed as well. (C) 2008 American Institute of Physics.
2008
93
15
Sì, ma tipo non specificato
Article Number: 153109
Ippolito, Mariella; S., Meloni; Colombo, Luciano
1.1 Articolo in rivista
info:eu-repo/semantics/article
1 Contributo su Rivista::1.1 Articolo in rivista
262
3
none
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