Characterisation of an X-Ray System with GaAs Detector for Composite Material Analysis
BERTOLINO, FILIPPO;GATTO, GIANLUCA;GINESU, FRANCESCO;RANDACCIO, PAOLO
1998-01-01
Abstract
Here a first X-ray microtomograph for analysing defects in composite materials is described and characterised. After a brief presentation of the system, the characterisation tests conducted to assess its efficiency are discussed.File | Size | Format | |
---|---|---|---|
KEM1998-2.pdf Solo gestori archivio
Description: Articolo principale
Type: versione editoriale
Size 316.53 kB
Format Adobe PDF
|
316.53 kB | Adobe PDF | & nbsp; View / Open Request a copy |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.