Caratterizzazione di un tomografo di terza generazione
BERTOLINO, FILIPPO;GATTO, GIANLUCA;GINESU, FRANCESCO
1997-01-01
Abstract
Aim of this paper is both the description and the characterisation of a third generation X-ray microtomography. The setuo has been completely made in our laboratory for the non destructive analysis of composite materials. The characterisation tests, which evidence limits and possibilities of the system are discussed.File | Size | Format | |
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Aias97-1.pdf open access
Description: Articolo principale
Type: versione editoriale
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